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Review of Scientific Instruments

Volumn 82, Issue 9, 2011, Pages

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

(2) Wutscher, Elisabeth a Giessibl, Franz J a

a UNIVERSITY OF REGENSBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC STEP; DEFLECTION MEASUREMENT; DIAMOND TIP; EPITAXIAL GRAPHENE; FORCE SENSOR; HIGH RESOLUTION IMAGE; LIQUID ENVIRONMENT; NOISE SOURCE; Q-VALUES; QUARTZ TUNING FORK; SAMPLE SYSTEM; SILICON CANTILEVER; SMALL AMPLITUDE;

ATOMIC FORCE MICROSCOPY; CALCITE; CALCIUM CARBONATE; CARBONATE MINERALS; DISSOLUTION; GRAPHENE; MONOLAYERS; QUARTZ; SEMICONDUCTING SILICON COMPOUNDS; SENSORS;

LIQUIDS;

EID: 80053507363 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3633950 Document Type: Article

Times cited : (36)

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