True atomic resolution in liquid by frequency-modulation atomic force microscopy

Applied Physics Letters

Volumn 87, Issue 3, 2005, Pages

  Fukuma, Takeshi ^a   Kobayashi, Kei ^a   Matsushige, Kazumi ^a   Yamada, Hirofumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBATES; FORCE SENSING CANTILEVERS; MUSCOVITE MICA; TRUE ATOMIC RESOLUTION;

ATOMIC FORCE MICROSCOPY; CANTILEVER BRIDGES; DEFECTS; FREQUENCY MODULATION; MICA; OSCILLATIONS;

LIQUIDS;

EID: 24144473649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1999856     Document Type: Article

References (21)

1. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
2. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
3. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
4. M. Bammerlin, R. Lüthi, E. Meyer, A. Baratoff, J. Lü, M. Guggisberg, C. Gerber, L. Howald, and H.-J. Güntherodt, Probe Microsc. 1, 3 (1997).
5. F. J. Giessibl, Science 267, 68 (1995).
6. S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 2 34, L1086 (1995).
7. K. Fukui, H. Onishi, and Y. Iwasawa, Chem. Phys. Lett. 280, 296 (1997).
8. S. Orisaka, T. Minobe, T. Uchihashi, Y. Sugawara, and S. Morita, Appl. Surf. Sci. 140, 243 (1999).
9. C. Loppacher, M. Bammerlin, M. Guggisberg, F. Battiston, R. Bennewitz, S. Rast, A. Baratoff, E. Meyer, and H.-J. Güntherodt, Appl. Surf. Sci. 140, 287 (1999).
10. P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hilner, M. Bezanilla, M. Fritz, D. Vie, and H. G. Hansma, Appl. Phys. Lett. 64, 1738 (1994).
11. C. A. J. Putman, K. O. V. der Werf, G. D. Grooth, and N. F. V. Hulst, Appl. Phys. Lett. 64, 2454 (1994).
12. T. Fukuma, T. Ichii, K. Kobayashi, H. Yamada, and K. Matsushige, Appl. Phys. Lett. 86, 034103 (2005).
13. T. Fukuma, K. Kobayashi, K. Matsushige, and H. Yamada, Appl. Phys. Lett. 86, 193108 (2005).
14. T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige, and H. Yamada, Rev. Sci. Instrum. 76, 053704 (2005).
15. F. J. Giessibl, H. Bielefeldt, S. Hembacher, and J. Mannhart, Appl. Surf. Sci. 140, 352 (1999).
16. F. J. Giessibl, S. Hembacher, H. Bielefeldt, and J. Mannhart, Science 289, 422 (2000).
17. R. Erlandsson, G. Hadziioannou, C. M. Mate, G. M. McClelland, and S. Chiang, J. Chem. Phys. 89, 5190 (1988).
18. B. Drake, C. B. Prater, A. L. Weisenhorn, S. A. Gould, T. R. Albrecht, C. F. Quate, D. S. Cannell, H. G. Hansma, and P. K. Hansma, Science 243, 1586 (1989).
19. J. P. Cleveland, T. E. Schäffer, and P. K. Hansma, Phys. Rev. B 52, R8692 (1995).
20. S. P. Jarvis, T. Uchihashi, T. Ishida, and H. Tokumoto, J. Phys. Chem. 104, 6091 (2000).
21. Noncontact Atomic Force Microscopy Nanoscience and Technology, edited by, S. Morita, R. Wiesendanger, and, E. Meyer, (Springer, Berlin, 2002).