Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Fukuma, Takeshi ^a   Jarvis, Suzanne P ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; FREQUENCY MODULATION; LASER BEAMS; MICA; OPTICAL RESOLVING POWER; OPTICAL SENSORS;

ATOMIC FORCE MICROSCOPE; CANTILEVERS; DEFLECTION SENSORS;

MICROSCOPES;

EID: 33646386930     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2188867     Document Type: Article

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