Local work function measurements of epitaxial graphene

Applied Physics Letters

Volumn 93, Issue 13, 2008, Pages

  Filleter, T ^a   Emtsev, K V ^b   Seyller, Th ^b   Bennewitz, R ^a,c  

^a MCGILL UNIVERSITY   (Canada)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^c INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON CARBIDE; WORK FUNCTION;

BI-LAYER FILMS; BILAYER GRAPHENE; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; HIGH RESOLUTIONS; INTERFACE LAYERS; KELVIN PROBE FORCE MICROSCOPY; LOCAL WORK; SINGLE LAYERS; SINGLE-LAYER FILMS; STEP STRUCTURES; TOPOGRAPHIC IMAGING; WORK-FUNCTION DIFFERENCE;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 53349146063     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2993341     Document Type: Article

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