SCOPUS 정보 검색 플랫폼

Volumn 86, Issue 3, 2005, Pages 1-3

True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EVAPORATION; FEEDBACK; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SENSORS; SILICON;

FREQUENCY NOISE; MOLECULAR-SCALE STRUCTURE; SPRING CONSTANT; TUNNELING CURRENTS;

FREQUENCY MODULATION;

EID: 17044362244 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1852721 Document Type: Article

Times cited : (54)

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