Highly resolved scanning tunneling microscopy study of Si(0 0 1) surfaces flattened in aqueous environment

Surface Science

Volumn 600, Issue 15, 2006, Pages 185-188

  Arima, Kenta ^a   Kubota, Akihisa ^b   Mimura, Hidekazu ^a   Inagaki, Kouji ^a   Endo, Katsuyoshi ^a   Mori, Yuzo ^a   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b KUMAMOTO UNIVERSITY   (Japan)

Author keywords

Low index single crystal surfaces; Scanning tunneling microscopy; Silicon; Solid liquid interfaces; Surface structure, morphology, roughness and topography; Water

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; SILICA; SURFACE CHEMISTRY; SURFACE ROUGHNESS; WATER;

LOW INDEX SINGLE CRYSTAL SURFACES; SOLID-LIQUID INTERFACES; SURFACE PREPARATION; SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS AND TOPOGRAPHY;

SILICON;

EID: 33746012958     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.05.028     Document Type: Article

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