Oxidation of freestanding silicon nanocrystals probed with electron spin resonance of interfacial dangling bonds

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 15, 2011, Pages

  Pereira, R N ^a   Rowe, D J ^b   Anthony, R J ^b   Kortshagen, U ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961110682     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.155327     Document Type: Article

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