Frequency-dependent electron spin resonance study of Pb-type interface defects in thermal Si/SiO2

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 16, 2002, Pages 1653201-1653209

  Pierreux, D ^a   Stesmans, A ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON DIOXIDE;

ARTICLE; ELECTRON SPIN RESONANCE; HEATING; MATHEMATICAL ANALYSIS; OXIDATION; QUANTITATIVE ANALYSIS; TEMPERATURE DEPENDENCE;

EID: 0037110086     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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