Defects in planar Si pn junctions studied with electrically detected magnetic resonance

Applied Physics Letters

Volumn 76, Issue 16, 2000, Pages 2280-2282

  Wimbauer, T ^a   Ito, K ^a   Mochizuki, Y ^a   Horikawa, M ^a   Kitano, T ^a   Brandt, M S ^b   Stutzmann, M ^b  

^a NEC CORPORATION   (Japan)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001107649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126321     Document Type: Article

References (14)

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