Ultrathin Y2O3(111) films on Pt(111) substrates

Surface Science

Volumn 605, Issue 19-20, 2011, Pages 1826-1833

  Tao, Junguang ^a   Batzill, Matthias ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

Growth; Low index single crystal surfaces; Scanning tunneling microscopy

Indexed keywords

[110] DIRECTION; CUBIC LATTICE; IN-PLANE ORIENTATION; LOW INDEX SINGLE CRYSTAL SURFACES; OXYGEN ATMOSPHERE; POSTGROWTH ANNEALING; PT(111); ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY (STM); ULTRA-THIN; X RAY PHOTOEMISSION SPECTROSCOPY; XPS MEASUREMENTS;

EMISSION SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; OXIDE FILMS; PHYSICAL VAPOR DEPOSITION; PLATINUM; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTAL SURFACES; SINGLE CRYSTALS; SUBSTRATES; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM;

YTTRIUM ALLOYS;

EID: 79961029471     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.06.021     Document Type: Article

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