Surface structure of Sn-doped in2O3 (111) thin films by STM

New Journal of Physics

Volumn 10, Issue , 2008, Pages

  Morales, Erie H ^a   He, Yunbin ^a   Vinnichenko, Mykola ^b   Delley, Bernard ^c   Diebold, Ulrike ^a  

^a Tulane University   (United States)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; CHEMICAL REACTIONS; COORDINATION REACTIONS; CRYSTAL GROWTH; DENSITY FUNCTIONAL THEORY; DIFFRACTION; DOPING (ADDITIVES); ELECTRON DIFFRACTION; EPITAXIAL GROWTH; GRAFTING (CHEMICAL); HIGH ENERGY ELECTRON DIFFRACTION; LANDFORMS; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAMS; MOLECULAR DYNAMICS; MOLECULAR OXYGEN; MOLECULAR SPECTROSCOPY; OXYGEN; PHOTOELECTRON SPECTROSCOPY; PROGRAMMING THEORY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SOIL CONSERVATION; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE REACTIONS; SURFACE STRUCTURE; SYNTHESIS (CHEMICAL); THICK FILMS; TIN; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPIES; BIXBYITE; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORIES; FLAT SURFACES; HIGH QUALITIES; LOW-ENERGY ELECTRON DIFFRACTIONS; OXYGEN PLASMAS; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTIONS; SN-DOPED; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; STABILIZED ZIRCONIAS; STM IMAGES; SURFACE ATOMS; SURFACE CHEMICAL REACTIONS; XPS PEAK SHAPE ANALYSIS;

SURFACE MORPHOLOGY;

EID: 59849083331     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/12/125030     Document Type: Article

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