Low-energy electron diffraction structure determination of an ultrathin CoO film on Ag(0 0 1)

Surface Science

Volumn 603, Issue 16, 2009, Pages 2658-2663

  Schindler, K M ^a   Wang, J ^a   Chasse A ^a   Neddermeyer, H ^a   Widdra, W ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Cobalt oxide; Low energy electron diffraction (LEED); Metal oxide interface; Thin film structure

Indexed keywords

ATOMIC STRUCTURE; COBALT OXIDE; DRIVING FORCES; IN-PLANE; LAYER-BY-LAYER GROWTH; LOW-ENERGY ELECTRON DIFFRACTION (LEED); METAL-OXIDE INTERFACE; MULTIPLE SCATTERING CALCULATIONS; OXYGEN ATMOSPHERE; PSEUDOMORPHIC GROWTH; REACTIVE EVAPORATION; THIN FILM STRUCTURE; TWO-MATERIALS; ULTRA-THIN;

COBALT; COBALT COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; ELECTRONS; FILM GROWTH; LATTICE MISMATCH; LOW ENERGY ELECTRON DIFFRACTION; OXYGEN; SUBSTRATES; SURFACE RELAXATION; THICK FILMS; THIN FILM DEVICES; THIN FILMS;

SILVER;

EID: 68149083084     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.06.020     Document Type: Article

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