Growth mechanism and angle-resolved photoemission spectra of cobalt oxide (CoO) thin films on Ag(1 0 0)

Surface Science

Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 471-475

  Sindhu, S ^a   Heiler, M ^a   Schindler, K M ^a   Widdra, W ^a   Neddermeyer, H ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Angle resolved photoemission; Cobalt oxides; Growth; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; NICKEL COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SILVER; SINGLE CRYSTALS; SURFACE CHEMISTRY; SURFACE PHENOMENA; SYNCHROTRON RADIATION; THICKNESS CONTROL; THIN FILMS;

ANGLE RESOLVED PHOTOEMISSION; COBALT OXIDES; MOTT INSULATORS; SURFACE ELECTRONIC PHENOMENA;

COBALT COMPOUNDS;

EID: 4544241532     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.081     Document Type: Conference Paper

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