An X-ray photoelectron diffraction structural characterization of an epitaxial MnO ultrathin film on Pt(111)

Surface Science

Volumn 482-485, Issue PART 2, 2001, Pages 1474-1480

  Rizzi, G A ^a   Petukhov, M ^a,c   Sambi, M ^a   Zanoni, R ^b   Perriello, L ^b   Granozzi, G ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

^c KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

Epitaxy; Growth; Metal oxide semiconductor (MOS) structures; Metal semiconductor magnetic thin film structures; Photoelectron diffraction measurement; Surface chemical reaction; X ray photoelectron spectroscopy

Indexed keywords

EID: 0000776903     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00710-5     Document Type: Article

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