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Volumn 532-535, Issue , 2003, Pages 420-424
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Growth, structure and annealing behaviour of epitaxial ZrO2 films on Pt(1 1 1)
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Author keywords
Epitaxy; Growth; Low energy electron diffraction (LEED); Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography; Zirconium
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Indexed keywords
ANNEALING;
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
LOW ENERGY ELECTRON DIFFRACTION;
PLATINUM;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
VAPOR DEPOSITION;
ZIRCONIA;
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EID: 0037846274
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00187-0 Document Type: Conference Paper |
Times cited : (35)
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References (9)
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