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Volumn 532-535, Issue , 2003, Pages 420-424

Growth, structure and annealing behaviour of epitaxial ZrO2 films on Pt(1 1 1)

Author keywords

Epitaxy; Growth; Low energy electron diffraction (LEED); Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography; Zirconium

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL ORIENTATION; LOW ENERGY ELECTRON DIFFRACTION; PLATINUM; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

EID: 0037846274     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00187-0     Document Type: Conference Paper
Times cited : (35)

References (9)
  • 9
    • 0038527809 scopus 로고    scopus 로고
    • private communication
    • A. Eichler, private communication.
    • Eichler, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.