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Volumn 603, Issue 23, 2009, Pages 3382-3388
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A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)
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Author keywords
Ceria; Low energy electron diffraction; Model catalysts; Scanning tunneling microscopy; Ultra thin oxide films
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Indexed keywords
CERIA;
CERIA FILMS;
CERIUM OXIDES;
CU(1 1 1);
ELEVATED TEMPERATURE;
FLAT TERRACES;
GROWTH PROCESS;
INITIAL FILM;
LONG-RANGE ORDERING;
MODEL CATALYSTS;
MULTI-STEP;
OVERLAYERS;
OXYGEN ATMOSPHERE;
PREPARATION PROCEDURES;
REACTIVE DEPOSITION;
SAMPLE TEMPERATURE;
SCANNING TUNNELING MICROSCOPY (STM);
THIN FILM SYSTEMS;
THREE-DIMENSIONAL GROWTH;
ULTRA-THIN;
ULTRA-THIN OXIDE FILMS;
ATMOSPHERIC TEMPERATURE;
BALLOONS;
CATALYSIS;
CATALYSTS;
CERIUM;
CERIUM COMPOUNDS;
COPPER;
DEPOSITION;
DIFFRACTION;
FILM GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
MORPHOLOGY;
OXIDE FILMS;
OXYGEN;
PHYSICAL VAPOR DEPOSITION;
SCANNING;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTAL SURFACES;
SINGLE CRYSTALS;
SOIL CONSERVATION;
THIN FILMS;
THREE DIMENSIONAL;
WIND TUNNELS;
FILM PREPARATION;
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EID: 70449369439
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2009.09.031 Document Type: Article |
Times cited : (66)
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References (31)
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