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Volumn 109, Issue 12, 2011, Pages

10 MeV electrons irradiation effects in variously doped n-GaN

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE SPECTROSCOPIES; CARRIER REMOVAL RATE; DONOR CONCENTRATIONS; DOPED SAMPLE; DOPING LEVELS; EPITAXIAL LATERAL OVERGROWTH; HIGH DOSE; IRRADIATION EFFECT; MEV-ELECTRONS; N-TYPE CONDUCTIVITY; SHALLOW DONORS;

EID: 79960180558     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3596819     Document Type: Article
Times cited : (27)

References (37)
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    • edited by S. J. Pearton (Gordon and Breach, the Netherlands)
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    • (1999) GaN and Related Materials II , pp. 93-172
    • Popovici, G.1    Morkoc, H.2
  • 27
    • 0016510970 scopus 로고
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    • DOI 10.1063/1.1868059, 061301
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  • 35
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    • Vacancies as compensating centers in bulk GaN: Doping effects
    • DOI 10.1016/S0022-0248(02)01752-9, PII S0022024802017529
    • K. Saarinen, V. Ranki, T. Suski, M. Bochkowski, and I. Grzegory, J. Cryst. Growth 246, 281 (2002). 10.1016/S0022-0248(02)01752-9 (Pubitemid 35384484)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.