Optical detection of magnetic resonance in electron-irradiated GaN

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 16, 1997, Pages R10177-R10180

  Linde, Matthias ^a   Uftring, S ^a   Watkins, G ^a   Harle V ^b   Scholz, F ^b  

^a LEHIGH UNIVERSITY   (United States)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000394060     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.R10177     Document Type: Article

References (8)

1. D. M. Hoffmann, D. Kovalev, G. Steude, D. Volm, B. K. Meyer, C. Xavier, T. Monteiro, E. Pereira, E. N. Mokov, H. Amano, and A. Akasaki, in Gallium Nitride and Related Materials (Ref. 3), p. 619.
2. T. Ogino and N. Aoki, Jpn. J. Appl. Phys. 19, 2395 (1980).
3. M. H. Nazare, P. W. Mason, G. D. Watkins, and H. Kanda, Phys. Rev. B 51, 16 741 (1995).
4. R. Dingle, D. D. Sell, S. E. Stokowski, and M. Ilegems, Phys. Rev. B 4, 1211 (1971).
5. R. Dingle and R. Ilegems, Solid State Commun. 9, 175 (1971).
6. A. K. Koh and D. J. Miller, At. Data Nucl. Data Tables 33, 235 (1985).
7. K. M. Lee, in Defects in Electronic Materials, MRS Symposia Proceedings No. 104, edited by M. Stavola, S. J. Pearton, and G. Davies (Materials Research Society, Pittsburgh, 1988), p. 449.
8. T. A. Kennedy and M. G. Spencer, Phys. Rev. Lett. 57, 2690 (1986).