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Volumn 36, Issue 7 B, 1997, Pages
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Thick GaN epitaxial growth with low dislocation density by hydride vapor phase epitaxy
a a a a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
COALESCENCE;
CRYSTALS;
DISLOCATIONS (CRYSTALS);
SAPPHIRE;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
VAPOR PHASE EPITAXY;
GALLIUM NITRIDE;
HYDRIDE VAPOR PHASE EPITAXY;
SELECTIVE GROWTH;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0031187047
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.l899 Document Type: Article |
Times cited : (927)
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References (14)
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