Three dimensional atom probe imaging of GaAsSb quantum rings

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1073-1076

  Beltran A M ^a   Marquis, E A ^b,c   Taboada, A G ^d   Ripalda, J M ^d   Garcia J M ^d,e   Molina, S I ^a  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF MICHIGAN   (United States)

^d INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^e Department of Earth and Environmental Sciences   (United States)

Author keywords

Atom probe tomography; GaSb; Quantum ring; Transmission electron microscopy

Indexed keywords

ATOM PROBE TOMOGRAPHY; CAPPING PROCESS; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPY; GAAS; GASB; QUANTUM RING; SELF-ASSEMBLED; THREE-DIMENSIONAL ATOM PROBE; TRANSMISSION ELECTRON;

GALLIUM ALLOYS; GALLIUM ARSENIDE; IMAGE RECONSTRUCTION; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; NANORINGS; PROBES; SEMICONDUCTING GALLIUM; THREE DIMENSIONAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

ANTIMONY; ARSENIC; GALLIUM; NANOMATERIAL; QUANTUM DOT;

ARTICLE; ATOMIC PARTICLE; CHEMICAL COMPOSITION; COMPLEX FORMATION; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; IMAGE RECONSTRUCTION; MOLECULAR ELECTRONICS; NANOIMAGING; NANOPROBE; PARTICLE SIZE; PROCESS OPTIMIZATION; QUANTUM CHEMISTRY; RING OPENING; STRUCTURE ANALYSIS; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79959977686     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.03.018     Document Type: Article

References (52)

1. Lorke A., Luyken R.J., Govorov A.O., Kotthaus J.P., García J.M., Petroff P.M. Phys. Rev. Lett. 2000, 84:2223.
2. Kleemans N.A.J.M., Bominaar-Silkens I.M.A., Fomin V.M., Gladilin V.N., Granados D., Taboada A.G., García J.M., Offermans P., Zeitler U., Christianen P.C.M., Maan J.C., Devreese J.T., Koenraad P.M. Phys. Rev. Lett. 2007, 99:146808.
3. Teodoro M.D., Campo V.L., Lopez-Richard V., Marega E., Marques G., Galvão-Gobato Y., Iikawa F., Brasil M.J.S.P., AbuWaar Z.Y., Dorogan V.G., Mazur Y.I., Benamara M., Salamo G.J. Phys. Rev Lett. 2010, 104:086401.
4. Ribeiro E., Govorov A.O., Carvalho W., Medeiros-Ribeiro G. Phys. Rev. Lett. 2004, 92:126402.
5. Sellers I.R., Whiteside V.R., Kuskovsky I.L., Govorov A.O., McCombe B.D. Phys. Rev. Lett. 2008, 100:136405.
6. Hatami F., Grundmann M., Ledentsov N.N., Heinrichsdorff F., Heitx R., Bohrer J., Bimberg D., Ruvinov S.S., Werner P., Ustinov V.M., Kop'ev P.S., Alferov Z.I. Phys. Rev. B 1998, 57:4635.
7. Suzuki K., Hogg R.A., Arakawa Y. J. Appl. Phys. 1998, 85:8349.
8. Farrer I., Murphy M.J., Ritchie D.A., Shields A.J. J. Cryst. Growth 2003, 251:771.
9. Nakai T., Iwasaki S., Yamaguchi K. Jpn. J. Appl. Phys. 2004, 43:2122.
10. Geller M., Kapteyn C., Müller-Kirsch L., Heitz R., Bimberg D. Appl. Phys. Lett. 2003, 82:2706.
11. Cuadra L., Marti A., Luque A. J. Phys. E 2002, 14:162.
12. Laghumavarapu R.B., Moscho A., Khoshakhlagh A., El-EMawy M., Lester L.F., Huffaker D.L. Appl. Phys. Lett. 2007, 90:173125.
13. Wang T., Forchel A. J. Appl. Phys. 1999, 85:2591.
14. Bennett B.R., Magno R., Shanabrook B.V. Appl. Phys. Lett. 1996, 68:505.
15. Fu K., Fu Y. Appl. Phys. Lett. 2009, 94:181913.
16. Timm R., Eisele H., Lenz A., Becker S.K., Grabowski J., Kim T.-Y., Müller-Kirsch L., Pötschke K., Pohl U.W., Bimberg D., Dähne M. Appl. Phys. Lett. 2004, 85:5890.
17. Pitts O.J., Watkins S.P., Wang C.X., Stotz J.A.H., Meyer T.A., Thewalt M.L.W. J. Cryst. Growth 2004, 269:187.
18. Timm R., Eisele H., Lenz A., Ivanova L., Balakrishnan G., Huffaker D.L., Dahne M. Phys. Rev. Lett. 2008, 101:256101.
19. Timm R., Feenstra R.M., Eisele H., Lenz A., Ivanova L., Lenz E., Dahne M. J. Appl. Phys. 2009, 105:093718.
20. Kobayashi S., Jiang C., Kawazu T., Sakaki H. Jpn. J. Appl. Phys. 2004, 43:L662.
21. Molina S.I., Beltran A.M., Ben T., Galindo P.L., Guerrero E., Taboada A.G., Ripalda J.M., Chisholm M.F. Appl. Phys. Lett. 2009, 94:043114.
22. Alonso-González P., González L., Fuster D., González Y., Taboada A.G., Ripalda J.M., Beltrán A.M., Sales D.L., Ben T., Molina S.I. Cryst. Growth Des. 2009, 9:1216.
23. Lee B.C., Voskoboynikov C.P., Lee C. J. Phys. E 2004, 24:87.
24. Garcia J.M., Medeiros-Ribeiro G., Schmidt K., Ngo T., Feng J.L., Lorke A., Kotthaus J., Petroff P.M. Appl. Phys. Lett. 1997, 83:2014.
25. Lorke A., Luyken R.J., Govorov A.O., Kotthaus J.P., Garcia J.M., Petroff P.M. Phys. Rev. Lett. 2000, 84:2223.
26. Lorke A., Blossey R., García J.M., Bichler M., Abstreiter G. Mater. Sci. Eng. B 2002, 88:225.
27. Takehana K., Pulizzi F., Patane A., Henini M., Main P.C., Eaves L., Granados D., García J.M. J. Cryst. Growth 2003, 251:155.
28. Granados D., García J.M. J. Cryst. Growth 2003, 251:213.
29. Cui J., He Q., Jiang X.M., Fan Y.L., Yang X.J., Xue F., Jiang Z.M. Appl. Phys. Lett. 2003, 83:2907.
30. Gong G., Offermans P., Nötzel R., Koenraad P.M., Wolter J.H. Appl. Phys. Lett. 2003, 85:5697.
31. Offermans P., Koenraad P.M., Wolter J.M., Granados D., Garcia J.M., Fomin V.M., Gladilin V.N., Devreese J.T. J. Phys. E 2006, 32:41.
32. Ulloa J.M., Drouzas I.W.D., Koenraad P.M., Mowbray D.J., Steer M.J., Liu H.Y., Hopkinson M. Appl. Phys. Lett. 2007, 90:213105.
33. Scheerschmidt K.K., Werner P. Nanoscience and Nanotechnology 2002, Springer, New York.
34. Beanland R. Ultramicroscopy 2005, 102:115.
35. Zhi D., Davock H., Murray R., Roberts C., Jones T.S., Parshley D.W., Goodhew P.J., Joyce B.A. J. Appl. Phys. 2001, 89:2079.
36. Wang P., Bleloch A.L., Goodhew P.J., Ng J., Missous M. Appl. Phys. Lett. 2006, 89:072111.
37. Midgley P.A., Weyland M. Ultramicroscopy 2003, 96:413.
38. Friedrich H., McCartney M.R., Buseck P.R. Ultramicroscopy 2005, 106:18.
39. Kelly T.F., Miller M.K. Rev. Sci. Instrum. 2007, 78:031101.
40. Cerezo A., Grovenor C.R.M., Smith G.D.W. Appl. Phys. Lett. 1985, 46:567.
41. Kelly T.F., Larson D.J., Thompson K., Alvis R.L., Bunton J.H., Olson J.D., Gorman B.P. Annu. Rev. Mater. Res. 2007, 37:681.
42. Chen Y.M., Ohkubo T., Kodzuka M., Morita K., Hono K. Scr. Mater. 2009, 61:693.
43. Alonso-Alvarez D., Alén B., García J.M., Ripalda J.M. Appl. Phys. Lett. 2007, 9:263103.
44. Thompson K., Lawrence D., Larson D.J., Olson J.D., Kelly T.F., Gorman B. Ultramicroscopy 2007, 107:131.
45. B. Gault, F. Vurpillot, E.A. Marquis, M. Moody, D.W. Saxey, G.D.W. Smith, Reports on Progress in Physics, in press.
46. M. Muller, D.W. Saxey, G.D.W. Smith, B. Gault, Ultramicroscopy, in press, doi:. http://10.1016/j.ultramic.2010.11.019.
47. Schowalter M., Rosenauer A., Gerthsen D., Grau M., Amann M.-C. Appl. Phys. Lett. 2003, 83:3123.
48. Xiong M., Li M., Qiu Y., Zhao Y., Wang L., Zhao L. Phys. Stat. Solidi (b) 2010, 247:303.
49. Wang M.W., Collins D.A., McGill T.C., Grant R.W., Feenstra R.M. J. Vac. Sci. Technol. B 1995, 13:1689.
50. Esser N., Shkrebtii A.I., Resch-Esser U., Springer C., Richter W., Schmidt W.G., Bechstedt F., Sole R.D. Phys. Rev. Lett. 1996, 77:4402.
51. Laukkanen P., Perala R.E., Vaara R.L., Vayrynen I.J., Kuzmin M., Sadowsky M. J. Phys. Rev. B 2004, 69:205323.
52. Timm R., Eisele H., Lenz A., Ivanova L., Dähne M., Balakrishnan G., Huffaker D.L., Farrer I., Ritchie D.A. J. Vac. Sci. Technol. B 2008, 26:1492.