Some aspects of the field evaporation behaviour of GaSb

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 487-492

  Muller M ^a   Saxey, D W ^a,b   Smith, G D W ^a   Gault, B ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Atom probe tomography; Compound semiconductors; Field evaporation; Gallium antimonide

Indexed keywords

ATOM LASERS; ATOMS; ELECTRIC FIELDS; EVAPORATION; III-V SEMICONDUCTORS; PROBES; TUNGSTEN;

ATOM PROBE TOMOGRAPHY; COMPOSITION DETERMINATION; COMPOUND SEMICONDUCTORS; EXPERIMENTAL CONDITIONS; FIELD EVAPORATION; GALLIUM ANTIMONIDE; RELATIVE ABUNDANCE; SPATIAL CORRELATIONS;

GALLIUM ALLOYS;

ALUMINUM DERIVATIVE; ANTIMONY DERIVATIVE; GALLIUM; GALLIUM ANTIMONIDE; TUNGSTEN DERIVATIVE; UNCLASSIFIED DRUG;

ACCURACY; ARTICLE; CONTROLLED STUDY; DISSOCIATION; ELECTRIC FIELD; EVAPORATION; FIELD EVAPORATION; MASS SPECTROMETRY; MICROANALYSIS; PULSED LASER ATOM PROBE TOMOGRAPHY; SEMICONDUCTOR; TOMOGRAPHY;

EID: 80052547008     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.019     Document Type: Article

References (45)

1. A. Cerezo, P.H. Clifton, S. Lozano-Perez, P. Panayi, G. Sha, G.D.W. Smith, Microscopy and Microanalysis 13 (2007) 408-417.
2. T.F. Kelly, M.K. Miller, Review of Scientific Instruments 78 (2007) 031101.
3. J.H. Bunton, J.D. Olson, D.R. Lenz, T.F. Kelly, Microscopy and Microanalysis 13 (2007) 418-427.
4. A. Cerezo, P.H. Clifton, A. Gomberg, G.D.W. Smith, Ultramicroscopy 107 (2007) 720-725.
5. B. Gault, F.Vurpillot, A.Vella, M. Gilbert, A. Menand, D. Blavette, B. Deconihout, Review of Scientific Instruments 77 (2006) 043705.
6. P. Stender, C. Oberdorfer, M. Artmeier, P. Pelka, F. Spaleck, G. Schmitz, Ultramicroscopy 107 (2007) 726-733.
7. G.L Kellogg, T.T. Tsong, Journal of Applied Physics 51 (2) (1980) 1184-1193.
8. T.T. Tsong, S.B. McLane, T.J. Kinkus, Review of Scientific Instruments 53 (1982) 1442-1448.
9. D.G. Brandon, Philosophical Magazine 14 (1966) 803-820.
10. M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith, Atom Probe Field Ion Microscopy, Oxford Science Publications-Clarendon Press, Oxford, UK, 1996.
11. F. Vurpillot, J. Houard, A. Vella, B. Deconihout, Journal of Physics D-Applied Physics 42 (2009) 125502.
12. F. Vurpillot, B. Gault, A. Vella, M. Bouet, B. Deconihout, Applied Physics Letters 88 (2006) 094105.
13. T.T. Tsong, Physical Review B 30 (1984) 4946-4961.
14. T.T. Tsong, Journal de Physique 45-C9 (1984) 83-87.
15. A. Cerezo, C.R.M. Grovenor, G.D.W. Smith, Applies Physics Letters 46 (1985) 567-569.
16. B.P. Gorman, A.G. Norman, Y. Yan, Microscopy and Microanalysis 13 (2007) 493-502.
17. T. Prosa, R. Alvis, T. Kelly, Microscopy and Microanalysis 14 (2008) 1236-1237.
18. B. Gault, E.A. Marquis, D.W. Saxey, G.M. Hughes, D. Mangelinck, E.S. Toberer, G.J. Snyder, Scripta Materialia 63 (2010) 784-787.
19. A. Cerezo, C.R.M. Grovenor, G.D.W. Smith, Journal of Microscopy 141 (1986) 155.
20. G.L. Kellogg, Journal of Applied Physics 52 (1981) 5320-5328.
21. F. Tang, B. Gault, S.P. Ringer, J.M. Cairney, Ultramicroscopy 110 (2010) 836-843.
22. K. Thompson, D. Lawrence, D.J. Larson, J.D. Olson, T.F. Kelly, B. Gorman, Ultramicroscopy 107 (2007) 131-139.
23. M.K. Miller, Atom Probe Tomography: Analysis at the Atomic Level, Springer, US, 2000, 250 pp. ISBN:0306464152.
24. R. Haydock, D.R. Kingham, Physical Review Letters 44 (1980) 1520-1523.
25. D.R. Kingham, Surface Science 116 (1982) 273-301.
26. A. Shariq, S. Mutas, K. Wedderhoff, C. Klein, H. Hortenbach, S. Teichert, P. Kucher, S.S.A. Gerstl, Ultramicroscopy 109 (2009) 472-479.
27. F. De Geuser, B. Gault, A. Bostel, F. Vurpillot, Surface Science 601 (2007) 536-543.
28. L Yao, B. Gault, J.M. Cairney, S.P. Ringer, Philosophical Magazine Letters 90 (2010) 121-129.
29. M.G. Hetherington, A. Cerezo, J. Hyde, G.D.W. Smith, G.M. Worrall, Journal de Physique 47-C7 (1986) 495-501.
30. E. Camus, C. Abromeit, Journal of Applied Physics 75 (1994) 2373-2382.
31. M.P. Moody, L.T. Stephenson, P.V. Liddicoat, S.P. Ringer, Microscopy Research and Technique 70 (2007) 258.
32. D.W. Saxey, Ultramicroscopy, this issue, doi:10.1016/j.ultramic.2010.11.021.
33. D.J. Larson, M.K. Miller, R.M. Ulfig, R.J. Matyi, P.P. Camus, T.F. Kelly, Ultramicroscopy 73 (1998) 273-278.
34. T. Sakurai, T. Hashizume, A. Jimbo, T. Sakata, Journal de Physique 45-C9 (1984) 453-458.
35. B. Gault, F. Vurpillot, E.A. Marquis, M.P. Moody, D.W. Saxey, G.D.W. Smith, Reports on Progress in Physics, in press.
36. T.T. Tsong, Physical Review Letters 55 (1985) 2826.
37. T.T. Tsong, Surface Science Reports 8 (1988) 127-209.
38. C. Brechignac, P. Cahuzac, F. Carlier, M. Defrutos,J. Leygnier,J.P. Roux, Journal of Chemical Physics 102 (1995) 763-769.
39. M.E. Geusic, R.R. Freeman, M.A. Duncan, Journal of Chemical Physics 89 (1988) 223-229.
40. L Renaud, Ph.D Thesis, University of Rouen, France, 2001.
41. B.S. Everitt, The Analysis of Contingency Tables, second ed. ed, Chapman & Hall/CRC, 1992.
42. J. Liu, T.T. Tsong, Physical Review B 38 (1988) 8490-8493.
43. D.W. Bassett, D.R. Tice, Surface Science 40 (1973) 499-511.
44. W. Driesel, C. Dietzsch, H. Niedrig, B. Praprotnik, Ultramicroscopy 57 (1995) 45-58.
45. A.U. MacRae, Surface Science 4 (1966) 247-264.