Understanding and modeling AC BTI

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Reisinger, Hans ^a   Grasser, Tibor ^b   Ermisch, Karsten ^a   Nielen, Heiko ^a   Gustin, Wolfgang ^a   Schlunder, Christian ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

AC stress; NBTI; recovery

Indexed keywords

AC-STRESS; ALTERNATING STRESS; BORDER TRAPS; EMISSION TIME; EXPERIMENTAL DATA; NBTI; TECHNOLOGY PARAMETERS;

INTEGRATED CIRCUITS;

EID: 79959297027     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784542     Document Type: Conference Paper

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