NBTI from the perspective of defect states with widely distributed time scales

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 55-60

  Kaczer, B ^a   Grasser, T ^b   Martin Martinez, J ^c   Simoen, E ^a   Aoulaiche, M ^a   Roussel, Ph J ^a   Groeseneken, G ^d  

^a IMEC   (Belgium)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^d UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

1 f noise; Negative bias temperature instability (NBTI); pFET; Reliability; Single charge events

Indexed keywords

1/F NOISE; DEFECT STATE; DISTRIBUTED TIME; NEGATIVE BIAS TEMPERATURE INSTABILITY; NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); PFET; SINGLE CHARGE EVENTS; SMALL DEVICES;

DEFECTS; RELIABILITY; THERMODYNAMIC STABILITY;

NEGATIVE TEMPERATURE COEFFICIENT;

EID: 70449089008     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173224     Document Type: Conference Paper

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