Highly accurate product-level aging monitoring in 40nm CMOS

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 27-28

  Hofmann, K ^a   Reisinger, H ^a   Ermisch, K ^a   Schlunder C ^a   Gustin, W ^a   Pompl, T ^a   Georgakos, G ^a   Arnim, K V ^a   Hatsch, J ^a   Kodytek, T ^a   Baumann, T ^a   Pacha, C ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVITY-DEPENDENT; AGING MONITORING; CIRCUIT PERFORMANCE; COMPREHENSIVE ANALYSIS; CRITICAL PATHS; HIGH FREQUENCY; HOT CARRIER STRESS; NEGATIVE BIAS INSTABILITIES; OPERATING CONDITION; SWITCHING ACTIVITIES;

INTEGRATED CIRCUIT TESTING;

VLSI CIRCUITS;

EID: 77957860609     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556134     Document Type: Conference Paper

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6. J. Keane, et al. VLSI 2009, .
7. T. Baumann, et al. DAC 2009, .
8. T. Lueftner, et al. ISSCC 2006.