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Volumn 57, Issue 15, 1998, Pages 9225-9233
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Scanning-electrostatic-force microscopy: Self-consistent method for mesoscopic surface structures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037577893
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.9225 Document Type: Article |
Times cited : (19)
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References (13)
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