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Volumn 57, Issue 15, 1998, Pages 9225-9233

Scanning-electrostatic-force microscopy: Self-consistent method for mesoscopic surface structures

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Indexed keywords


EID: 0037577893     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.9225     Document Type: Article
Times cited : (19)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.