Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3707-3710

  Choi, Nami ^a   Uchihashi, Takayuki ^a   Nishijima, Hidehiro ^b   Ishida, Takao ^c,d   Mizutani, Wataru ^c   Akita, Seiji ^b   Nakayama, Yoshikazu ^b   Ishikawa, Mitsuru ^a   Tokumoto, Hiroshi ^c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b Osaka Prefecture University   (Japan)

^c NATL INST FOR ADV INTERDISC RES   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Carbon nanotube AFM tip; High resolution AFM image; Single walled carbon nanotubes; Tapping mode AFM

Indexed keywords

AMINES; ATOMIC FORCE MICROSCOPY; CARBON; OPTICAL RESOLVING POWER;

DIMETHYLFORMAMIDE;

NANOTUBES;

EID: 0034205170     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3707     Document Type: Article

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