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Volumn 50, Issue 4 PART 2, 2011, Pages

Transmission electron microscopy and raman-scattering spectroscopy observation on the interface structure of graphene formed on Si substrates with various orientations

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; INTERFACE LAYER; INTERFACE STRUCTURES; SCATTERING SPECTROSCOPY; SI (1 1 1); SI ATOMS; SI SUBSTRATES; SI(111) SUBSTRATE; SIC FILMS; SIC THIN FILMS;

EID: 79955454459     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.04DH02     Document Type: Article
Times cited : (22)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.