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Ultramicroscopy

Volumn 108, Issue 7, 2008, Pages 656-662

STEM nanodiffraction technique for structural analysis of CoPt nanoparticles

(6) Alloyeau, D a,b Ricolleau, C a Oikawa, T a,c Langlois, C a Le Bouar, Y b Loiseau, A b

a UNIVERSITÉ PARIS DIDEROT (France)

b Centre National de la Recherche Scientifique (France)

c JEOL LTD (Japan)

Author keywords

CoPt nanoparticles; Nanodiffraction; Order disorder transformation; Size effects; TEM STEM

Indexed keywords

AMORPHOUS ALLOYS; COBALT ALLOYS; SUPERCONDUCTING TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

MICROSCOPE ILLUMINATION; NANODIFFRACTION;

NANOPARTICLES;

COBALT PLATINUM; NANOPARTICLE;

ARTICLE; ELECTRON DIFFRACTION; NANODIFFRACTION; NANOPROBE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 44149104088 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2007.10.006 Document Type: Article

Times cited : (39)

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