Orientation imaging in scanning electron and transmission electron microscopy for characterization of the shear banding phenomenon

Microchimica Acta

Volumn 155, Issue 1-2, 2006, Pages 243-250

  Paul, Henryk ^a,b   Morawiec, Adam ^a,c   Bouzy, Emmanuel ^c   Fundenberger, Jean Jacques ^c   Pia̧tkowski, Andrzej ^a  

^a INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

^b UNIVERSITY OF ZIELONA GÓRA   (Poland)

^c CNRS   (France)

Author keywords

Electron diffraction; Microtexture; Orientation imaging microscopy; Shear band

Indexed keywords

EID: 33748559826     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0550-9     Document Type: Conference Paper

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