Polycrystal orientation maps from TEM

Ultramicroscopy

Volumn 96, Issue 2, 2003, Pages 127-137

  Fundenberger, J J ^a   Morawiec, A ^b   Bouzy, E ^a   Lecomte, J S ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

^b INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

Author keywords

Convergent beam electron diffraction (CBED); Data processing image processing; Electron diffraction; Instrument control and alignment

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; OPTICAL RESOLVING POWER; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

POLYCRYSTAL ORIENTATION MAPS;

POLYCRYSTALS;

ALUMINUM; CRYSTALLIN;

ACCURACY; ARTICLE; CAMERA; COMPUTER SYSTEM; ELECTRON DIFFRACTION; IMAGE ANALYSIS; IMAGING; PLASTICITY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037411772     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00435-7     Document Type: Article

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