X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy

Materials Characterization

Volumn 54, Issue 2, 2005, Pages 131-140

  Kapoor, K ^a   Lahiri, D ^a   Batra, I S ^b   Rao, S V R ^a   Sanyal, T ^a  

^a Adv Mat Characterisation Lab   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Cu Cr Zr alloy; Stacking fault energy; Stacking fault probability; X ray line profile analysis

Indexed keywords

CHROMIUM ALLOYS; COPPER ALLOYS; CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); FATIGUE OF MATERIALS; HEAT RESISTANCE; HEAT TRANSFER; MICROSTRUCTURE; TENSILE TESTING; THERMAL CONDUCTIVITY; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

CU-CR-ZR ALLOYS; STACKING FAULT ENERGY (SFE); STACKING FAULT PROBABILITY (SFP); X-RAY LINE PROFILE ANALYSIS (LPA);

ZIRCONIUM ALLOYS;

EID: 14044276323     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.09.009     Document Type: Article

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