Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Zeitschrift fur Kristallographie

Volumn 225, Issue 2-3, 2010, Pages 103-109

  Rauch, Edgar F ^a   Portillo, Joaquin ^b,c   Nicolopoulos, Stavros ^b   Bultreys, Daniel ^b   Rouvimov, Sergei ^c   Moeck, Peter ^d  

^a CNRS   (France)

^b NanoMEGAS   (Belgium)

^c UNIVERSITY OF BARCELONA   (Spain)

^d Oregon Nanoscience and Microtechnologies Institute Portland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77956119875     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2010.1205     Document Type: Article

References (39)

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