Thermal calibration of photodiode sensitivity for atomic force microscopy

Review of Scientific Instruments

Volumn 77, Issue 11, 2006, Pages

  Attard, Phil ^a   Pettersson, Torbjörn ^b   Rutland, Mark W ^b  

^a UNIVERSITY OF SYDNEY   (Australia)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; ELECTRIC POTENTIAL; HARD FACING; SURFACE PHENOMENA; THERMOANALYSIS;

CANTILEVER ANGLE; PHOTODIODE SENSITIVITY; THERMAL CALIBRATION; VIBRATION MODE; VOLTAGE NOISE;

PHOTODIODES;

EID: 33751574439     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2387891     Document Type: Article

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