Thickness effect on the dielectric, ferroelectric, and piezoelectric properties of ferroelectric lead zirconate titanate thin films

Journal of Applied Physics

Volumn 108, Issue 11, 2010, Pages

  Prez De La Cruz J ^a   Joanni, E ^a   Vilarinho, P M ^b   Kholkin, A L ^b  

^a UNIVERSITY OF PORTO   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRIC PROPERTIES; FERROELECTRICITY; GRAIN SIZE AND SHAPE; MOS DEVICES; PEROVSKITE; PIEZOELECTRICITY; PLATINUM; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SILICON COMPOUNDS; SOL-GEL PROCESS; SUBSTRATES; THIN FILMS; WALLS (STRUCTURAL PARTITIONS);

DOMAIN STRUCTURE; DOMAIN WALL MOTION; ELECTRICAL PROPERTY; ELECTRODE LAYERS; FILM ORIENTATIONS; GRAIN SIZE; INTERFACE LAYER; LEAD ZIRCONATE TITANATE; LEAD ZIRCONATE TITANATE THIN FILMS; MEAN-GRAIN SIZE; MICROSCOPIC PIEZORESPONSE; PARALLEL CAPACITORS; PEROVSKITE PHASE; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC RESPONSE; PT(111); PZT; SCANNING FORCE MICROSCOPY; SI SUBSTRATES; SOL-GEL METHODS; SUBSTRATE CLAMPING; THICKNESS EFFECT;

FERROELECTRIC FILMS;

EID: 78751555907     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3514170     Document Type: Article

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