Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2777-2783

  Cillessen, J F M ^a   Prins, M W J ^a   Wolf, R M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; DEPOSITION; ELECTRIC PROPERTIES; FILM GROWTH; LANTHANUM COMPOUNDS; LEAD COMPOUNDS; MATHEMATICAL MODELS; MICROSTRUCTURE; PULSED LASER APPLICATIONS; SWITCHING; THIN FILM DEVICES;

CHARGE INJECTION; COERCIVE FIELD; FILM THICKNESS; LANTHANUM STRONTIUM COBALT OXIDE; LEAD ZIRCONIUM TITANATE; PULSED LASER DEPOSITION; SWITCHING VOLTAGE; THIN FILM CAPACITORS;

CAPACITORS;

EID: 0031102101     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363961     Document Type: Article

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