|
|
Volumn 44, Issue 3, 2009, Pages 515-521
|
|
Sol-gel reaction stability studied: Influence in the formation temperature and properties of ferroelectric thin films
a
|
|
Author keywords
Ferroelectricity; Raman spectroscopy; Sol gel chemistry; Thin film
|
|
Indexed keywords
COLLOIDS;
DECOMPOSITION;
DISTILLATION;
FERROELECTRIC FILMS;
FERROELECTRIC THIN FILMS;
FERROELECTRICITY;
FILM PREPARATION;
GELATION;
GELS;
GRAIN GROWTH;
GRAVIMETRIC ANALYSIS;
MICROSTRUCTURE;
OXIDE MINERALS;
PEROVSKITE;
PIEZOELECTRIC ACTUATORS;
PIEZOELECTRIC MATERIALS;
PIEZOELECTRIC TRANSDUCERS;
PYROLYSIS;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING LEAD COMPOUNDS;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SPECTRUM ANALYSIS;
THERMOGRAVIMETRIC ANALYSIS;
THIN FILM DEVICES;
THIN FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
ZIRCONIUM;
2-METHOXYETHANOL;
AGING EFFECTS;
COLUMNAR GRAINS;
DECOMPOSITION RATES;
DIFFERENTIAL THERMOGRAVIMETRIC ANALYSIS;
DISTILLATION PROCESS;
ELECTRICAL PERFORMANCE;
FERROELECTRIC AND PIEZOELECTRIC PROPERTIES;
FILM MICROSTRUCTURES;
FORMATION TEMPERATURES;
INTERCONNECTIVITY;
LEAD ACETATES;
LEAD ZIRCONIUM TITANATES;
MICROSTRUCTURAL ANALYSIS;
PHASE FORMATIONS;
PRECURSOR SOLUTIONS;
PURE PEROVSKITE PHASE;
PZT;
PZT FILMS;
RAMAN TECHNIQUES;
SCANNING ELECTRON MICROSCOPES;
SOL-GEL CHEMISTRY;
SOL-GEL REACTIONS;
SOL-GEL SOLUTIONS;
THERMAL DECOMPOSITION PROCESS;
THIN FILM;
X-RAY DIFFRACTIONS;
XRD ANALYSIS;
SOLUTION MINING;
|
|
EID: 58849126880
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/j.materresbull.2008.07.010 Document Type: Article |
|
Times cited : (8)
|
|
References (26)
|
