The nanoworld: Chances and challenges

Microelectronic Engineering

Volumn 32, Issue 1-4 SPEC. ISS., 1996, Pages 5-14

  Rohrer, Heinrich ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Nanomechanics; Nanoscience; Nanotechnology

Indexed keywords

ATOMIC PHYSICS; ELECTRONS; MINIMIZATION OF SWITCHING NETS; NANOTECHNOLOGY; SIZE DETERMINATION;

MINIATURIZATION;

MICROELECTRONICS;

EID: 0030231575     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-9317(95)00173-5     Document Type: Article

References (24)

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2. R.S. Kuchibhotla is acknowledged for compiling the data from E.W. Paugh, Building IBM (The MIT Press, Cambridge, MA, 1995) and The Computer Industry Almanac 1994-1995, Egil and Karen Petska Juliussen, eds., (Computer Industry Almanac Inc., Incline Village, NY, 1994) 397.
3. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
4. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
5. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
6. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
7. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
8. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
9. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
10. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Appl. Phys. Lett. 40 (1982) 178 and Physica B 109/110 (1982) 2075. For reviews see the following volumes of the NATO ASI Series E: Applied Sciences (Kluwer Academic Publishers, Dordrecht): Vol. 239, Atomic and Nanometer-Scale Modifications of Materials: Fundamentals and applications, Ph. Avouris, ed. (1993); Vol. 242, Near Field Optics, D.W. Pohl and D. Courjon, eds. (1993); Vol. 286, Forces in Scanning Probe Methods, H.J. Güntherodt, D. Anselmetti and E. Meyer, eds. (1995); Vol. 292, Ultimate Limits of Fabrication and Measurements, M.E. Weiland and J.K. Gimzewski, eds. (1995). Proc. Intern. Conf. on Micro- and Nanoengineering 'MNE '94', Davos, Switzerland, 1994, in Microelectron. Engin. 27(1-4) (1995). See also the numerous textbooks on scanning-tunnelling and scanning-probe microscopy.
11. M.F. Crommie, C.P. Lutz and D.M. Eigler, Science 262 (1993) 218.
12. T.A. Jung, R.R. Schlittler, H. Tang, C. Joachim and J.K. Gimzewski, Science, 271 (1996) 181.
13. S. Hosaka, S. Hosoki, T. Hasegawa, H. Koyanagi, T. Shintani and M. Miyamoto, J. Vac. Sci. Technol. B 13 (1995), in press.
14. See: A.A. Gewirth and H. Siegenthaler, eds., Nanoscale Probes of the Solid/Liquid Interface, NATO ASI Series E, Vol. 288, Kluwer Academic Publishers, Dordrecht, 1995.
15. S.C. Minne, Ph. Flückiger, H.T. Soh and C.F. Quate, J. Vac. Sci. Technol. B 13 (1995) 1380-1385.
16. Vue Tien Binh, N. Garcia and H.L. Levanyuk, Rev. Sci. Instrum. 63 (1992) 1124; Surf. Sci. Lett. 301 (1994) 224.
17. Vue Tien Binh, N. Garcia and H.L. Levanyuk, Rev. Sci. Instrum. 63 (1992) 1124; Surf. Sci. Lett. 301 (1994) 224.
18. J.K. Gimzewski, Ch. Gerber, E. Meyer and R.R. Schlittler, Chem. Phys. Lett. 217 (1994) 589.
19. D. Rugar, O. Züger, S. Hoen, C.S. Yannoni, H.-M. Vieth and R.D. Kendrick, Science 264 (1994) 1560.
20. For a 'desk-top' quantum mechanics experiment involving nano dimensions, see J.L. Costa-Krämer, N. Garcia, P. Garcia-Mochales and P.A. Serena, Surface Sci., in press.
21. E. Delamarche, G. Sundarababu, H. Biebuyck, B. Michel, Ch. Gerber, H. Sigrist, H. Wolf, H. Ringsdorf, N. Xanthopoulos and H.J. Mathieu, Langmuir 12 (1996) 1997.
22. Talk given by Richard P. Feynmann on December 29, 1959, at the annual meeting of the American Physical Society, Pasadena, USA, reprinted in: H.D. Gilbert, ed., Miniaturization (Reinhold Publishing Corporation, New York, NY).
23. H. Rohrer, Il Nuovo Cimento 107A (1994) 989.
24. H. Rohrer, Ultramicroscopy 42-44 (1992) 1.