Materials science - Bridging dimensions: Demultiplexing ultrahigh-density nanowire circuits

Science

Volumn 310, Issue 5747, 2005, Pages 465-468

  Beckman, Robert ^a   Johnston Halperin, Ezekiel ^a   Luo, Yi ^a   Green, Jonathan E ^a   Heath, James R ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEMULTIPLEXING; LITHOGRAPHY; NETWORKS (CIRCUITS); SILICON;

LITHOGRAPHIC PATTERNING; SILICON NANOWIRES; SUBMICROMETER WIRES;

NANOSTRUCTURED MATERIALS;

NANOTECHNOLOGY;

ACCURACY; ARTICLE; CONCEPT FORMATION; DEMULTIPLEXER; DENSITY; DEVICE; ELECTRONICS; NANOTECHNOLOGY; PATTERN RECOGNITION; PITCH; PRIORITY JOURNAL; SIGNAL TRANSDUCTION;

EID: 27144503350     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1114757     Document Type: Article

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