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Volumn 52, Issue 12, 2004, Pages 3459-3466
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Strength of silicon, sapphire and glass in the subthreshold flaw region
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Author keywords
Glass; Nanoindentation; Sapphire; Silicon; Strength; Subthreshold flaws
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Indexed keywords
CRYSTALLINE MATERIALS;
ETCHING;
INDENTATION;
SAPPHIRE;
SILICON;
STRENGTH OF MATERIALS;
STRESS CONCENTRATION;
MICROSTRUCTURAL DEFECTS;
NANOINDENTATION;
SHEAR FAULTS;
SUBTHRESHOLD FLAWS;
GLASS;
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EID: 2942650505
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2004.03.043 Document Type: Article |
Times cited : (38)
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References (43)
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