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Volumn 52, Issue 12, 2004, Pages 3459-3466

Strength of silicon, sapphire and glass in the subthreshold flaw region

Author keywords

Glass; Nanoindentation; Sapphire; Silicon; Strength; Subthreshold flaws

Indexed keywords

CRYSTALLINE MATERIALS; ETCHING; INDENTATION; SAPPHIRE; SILICON; STRENGTH OF MATERIALS; STRESS CONCENTRATION;

EID: 2942650505     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.03.043     Document Type: Article
Times cited : (38)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.