A highly accurate microwave method for permittivity determination using corrected scattering parameter measurements

Journal of Electromagnetic Waves and Applications

Volumn 24, Issue 16, 2010, Pages 2179-2189

  Kadiroglu, F ^a   Hasar, U C ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION STANDARD; CALIBRATION TECHNIQUES; LOW LOSS MATERIAL; MEASUREMENT CELL; MEASUREMENT SYSTEM; MICROWAVE METHODS; SCATTERING PARAMETER MEASUREMENT;

PERMITTIVITY; PERMITTIVITY MEASUREMENT; SCATTERING PARAMETERS;

CALIBRATION;

EID: 78650091570     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939310793699046     Document Type: Article

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