A broadband and stable method for unique complex permittivity determination of low-loss materials

IEEE Transactions on Microwave Theory and Techniques

Volumn 57, Issue 2, 2009, Pages 471-477

  Hasar, Ugur Cem ^a,b   Westgate, Charles Roger ^b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York at Binghamton   (United States)

Author keywords

Amplitude; Materials testing; Microwave measurements; Permittivity

Indexed keywords

MATERIALS; MATERIALS TESTING; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY; REFLECTION; SCATTERING PARAMETERS; TELECOMMUNICATION SYSTEMS; UNCERTAINTY ANALYSIS;

AMPLITUDE; COMPLEX PERMITTIVITIES; COMPLEX PERMITTIVITY DETERMINATIONS; DISPERSIVE MATERIALS; LOW LOSS; LOW-LOSS MATERIALS; MICROWAVE MEASUREMENTS; MULTIPLE SOLUTIONS; PARAMETER MEASUREMENTS; S-PARAMETER MEASUREMENTS; S-PARAMETERS; UNCERTAINTY PROBLEMS;

DIELECTRIC MATERIALS;

EID: 60349108442     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2008.2011242     Document Type: Article

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