An improved method for microwave nondestructive dielectric measurement of layered media

Progress In Electromagnetics Research B

Volumn 10, Issue , 2008, Pages 145-161

  Zhang, H ^a   Tan, S Y ^a   Tan, H S ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; NONDESTRUCTIVE EXAMINATION; NUMERICAL METHODS; PERMITTIVITY; PROBES; SCATTERING PARAMETERS; SEISMIC RESPONSE;

APERTURE ADMITTANCES; COMPLEX PERMITTIVITY; DIELECTRIC MEASUREMENTS; LAYERED MEDIA; NON DESTRUCTIVE; PARALLEL PLATE WAVEGUIDE; PROBE MEASUREMENTS; SLAB THICKNESS;

INVERSE PROBLEMS;

EID: 85007020795     PISSN: 19376472     EISSN: None     Source Type: Journal    
DOI: 10.2528/PIERB08082701     Document Type: Article

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