A position-invariant calibration-independent method for permittivity measurements

Microwave and Optical Technology Letters

Volumn 51, Issue 6, 2009, Pages 1406-1408

  Hasar, U C ^a,b   Inan, O E ^c  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

^c Microwave Electronic Systems Inc (MIKES)   (Turkey)

Author keywords

Calibration; Microwave measurement; Permittivity measurement; Scattering parameters

Indexed keywords

COMPLEX PERMITTIVITY; COMPLEX SCATTERING PARAMETERS; SINGULARITY POINT;

CALIBRATION; CHLORINE COMPOUNDS; DIELECTRIC MATERIALS; EXTRACTION; MEASUREMENTS; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY MEASUREMENT; POLYVINYL CHLORIDES; SCATTERING; SCATTERING PARAMETERS; WIRELESS TELECOMMUNICATION SYSTEMS;

PERMITTIVITY;

EID: 63749121495     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.24364     Document Type: Article

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