Two new measurement methods for explicit determination of complex permittivity

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 11 PART 1, 1998, Pages 1614-1619

  Wan, Changhua ^a   Nauwelaers, Bart ^a   De Raedt, Walter ^a   Van Rossum, Marc ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Calibration; Permittivity measurement; Scattering parameters measurement

Indexed keywords

ALGORITHMS; CALIBRATION; ERROR ANALYSIS; ERROR CORRECTION; ESTIMATION; ITERATIVE METHODS; MATRIX ALGEBRA; MEASUREMENT ERRORS;

SCATTERING PARAMETERS MEASUREMENT; WAVE CASCADING MATRIX;

PERMITTIVITY MEASUREMENT;

EID: 0032202737     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.734537     Document Type: Article

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