A wideband line-line dielectrometric method for liquids, soils, and planar substrates

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 5, 2001, Pages 1343-1348

  Huynen, Isabelle ^a,b   Steukers, Catherine ^c   Duhamel, Fabienne ^d  

^a IEEE   (Belgium)

^b UCL   (Belgium)

^c BASF SE   (Germany)

^d NOKIA RESEARCH CENTER   (United States)

Author keywords

Liquid; Measurement; Microwaves; Permittivity; Soil; Substrate

Indexed keywords

LINE-LINE DIELECTROMETRIC METHOD; LINE-RETURN-LINE CALIBRATION TECHNIQUE; ORGANIC LIQUIDS; PLANAR DIELECTRIC SUBSTRATES;

CALIBRATION; LIQUIDS; MICROWAVE CIRCUITS; MILLIMETER WAVES; SCATTERING PARAMETERS; SOILS; SUBSTRATES;

PERMITTIVITY MEASUREMENT;

EID: 0035483623     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963208     Document Type: Article

References (18)

1. A dielectrometer for the measurement of substrate permittivity
2. Practical dielectric measurement of CLAD microwave substrates
3. Electrical test methods for microwave PCBs
4. Characterization of highly dispersive materials using composite coaxial cells: Electromagnetic analysis and wideband measurement
5. A 3-position transmission/reflection method for measuring the permittivity of low loss materials
6. Microstrip effective dielectric constant measurement and test of CAD models up to 20 GHz
7. Coaxial line reflection method for measuring dielectric properties of biological substances at radio and microwave frequencies-A review
8. Permittivity measurement using a short open-ended coaxial line probe
9. Radiation-correlated open-ended coax line technique for dielectric measurements of liquids up to 20 GHz
10. An uncertainty analysis for the measurement of intrinsic properties of materials by the combined transmission-reflection method
11. Extracting ε and μ of materials from vector reflection measurements
12. Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
13. A generalized theory and new calibration procedures for network analyzer self-calibration
14. Geological measurements of dielectric constant
15. Spectral domain form of new variational expression for very fast calculation of multi-layered planar line parameters