Accurate complex permittivity inversion from measurements of a sample partially filling a waveguide aperture

IEEE Transactions on Microwave Theory and Techniques

Volumn 58, Issue 2, 2010, Pages 451-457

  Hasar, Ugur Cem ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

Materials testing; Microwave measurements; Partially filling; Permittivity

Indexed keywords

COMPLEX PERMITTIVITY; CONVENTIONAL METHODS; DIFFERENT FREQUENCY; MEASUREMENT ACCURACY; MICROWAVE METHODS; PARTIALLY FILLING; POWER SERIES; PROPAGATION CONSTANT; SAMPLE THICKNESS; THIN MATERIALS; WAVEGUIDE APERTURES;

FILLING; MATERIALS TESTING; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY; PERMITTIVITY MEASUREMENT; WAVEGUIDES;

DIELECTRIC MATERIALS;

EID: 76849085019     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2009.2038444     Document Type: Article

References (48)

1. L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization. West Sussex, U.K.: Wiley, 2004.
2. R. Zoughi, Microwave Non-Destructive Testing and Evaluation. Dordrecht, The Netherlands: Kluwer, 2000.
3. B.-K. Chung, "Dielectric constant measurement for thin material at microwave frequencies," Prog. Electromagn. Res., vol.PIER 75, pp. 239-252, 2007.
4. K. A. Murata, A. Hanawa, and R. Nozaki, "Broadband complex permittivity measurement techniques of materials with thin configuration at microwave frequencies," J. Appl. Phys., vol.98, pp. 084 107-01-084 107-8, 2005.
5. M. C. Decreton and F. E. Gardiol, "Simple nondestructive method for the measurement of complex permittivity," IEEE Trans. Instrum. Meas., vol.IM-23, no.4, pp. 434-438, Dec. 1974.
6. H. Zhang, S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Prog. Electromagn. Res. B, vol.10, pp. 145-161, 2008.
7. R. Olmi, M. Tedesco, C. Riminesi, and A. Ignesti, "Thickness- independent measurement of the permittivity of thin samples in the band," Meas. Sci. Technol., vol.13, no.4, pp. 503-509, Apr. 2002.
8. J. Baker-Jarvis, M. D. Janezic, P. D. Domich, and R. G. Geyer, "Analysis of an open-ended coaxial probe with lift-off for nondestructive testing," IEEE Trans. Instrum. Meas., vol.43, no.5, pp. 711-718, Oct. 1994.
9. D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, "Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies," IEEE Trans. Instrum. Meas., vol.39, no.2, pp. 387-394, Apr. 1990.
10. K. M. Hock, "Error correction for diffraction and multiple scattering in free-space microwave measurement of materials," IEEE Trans. Microw. Theory Tech., vol.54, no.2, pp. 648-659, Feb. 2006.
11. U. C. Hasar, "A microcontroller-based microwave free-space measurement system for permittivity determination of lossy liquid materials," Rev. Sci. Instrum., vol.80, no.5, pp. 056 103-1-056 103-3, 2009.
12. C. L. P. Rubinger and L. C. Costa, "Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials," Microw. Opt. Technol. Lett., vol.49, pp. 1687-1690, 2007.
13. J. Baker-Jarvis, E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., vol.38, no.8, pp. 1096-1103, Aug. 1990.
14. K. Sarabandi and F. T. Ulaby, "Technique for measuring the dielectric constant of thin materials," IEEE Trans. Instrum. Meas., vol.37, no.4, pp. 631-636, Dec. 1988.
15. E. D. Kenneth and L. J. Buckley, "Dielectric materials measurement of thin samples at millimeter wavelengths," IEEE Trans. Instrum. Meas., vol.41, no.5, pp. 723-725, Oct. 1992.
16. B.-K. Chung, "A convenient method for complex permittivity measurement of thin materials at microwave frequencies," J. Phys. D, Appl. Phys., vol.39, pp. 1926-1931, 2006.
17. U. C. Hasar, "Elimination of the multiple-solutions ambiguity in permittivity extraction from transmission-only measurements of lossy materials," Microw. Opt. Technol. Lett., vol.51, no.2, pp. 337-341, Feb. 2009.
18. U. C. Hasar, "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Techol., vol.19, no.5, May 2008, 055 706 (10 pp).
19. U. C. Hasar and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., vol.57, no.2, pp. 471-477, Feb. 2009.
20. U. C. Hasar, "A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., vol.56, no.9, pp. 2129-2135, Sep. 2008.
21. U. C. Hasar, "Thickness-independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements," Prog. Electromagn. Res., vol.92, pp. 17-32, 2009.
22. U. C. Hasar, "A generalized formulation for permittivity extraction of low-to-high-loss materials from transmission measurement," IEEE Trans. Microw. Theory Tech., vol.58, no.2, pp. 411-418, Feb. 2009.
23. T. C.Williams, M. A. Stuchly, and P. Saville, "Modified transmissionreflection method for measuring constitutive parameters of thin flexible high-loss materials," IEEE Trans. Microw. Theory Tech., vol.51, no.5, pp. 1560-1566, May 2003.
24. W. B. Weir, "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, vol.62, no.1, pp. 33-36, Jan. 1974.
25. A. M. Nicolson and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., vol.IM-19, no.4, pp. 377-382, Nov. 1970.
26. U. C. Hasar and O. Simsek, "An accurate complex permittivity method for thin dielectric materials," Prog. Electromagn. Res., vol.91, pp. 123-138, 2009.
27. J. M. Catala-Civera, A. J. Canos, F. L. Penaranda-Foix, and E. De los Reyes Davo, "Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides," IEEE Trans. Microw. Theory Tech., vol.51, no.1, pp. 16-24, Jan. 2003.
28. J. M. Akhtar, L. E. Feher, and M. Thumm, "Noninvasive procedure for measuring the complex permittivity of resins, catalysts, and other liquids using a partially filled rectangular waveguide structure," IEEE Trans. Microw. Theory Tech., vol.57, no.2, pp. 458-470, Feb. 2009.
29. J. Pitarch, M. Contelles-Cervera, F. L. Penaranda-Foix, and J. M. Catala-Civera, "Determination of the permittivity and permeability for waveguides partially loaded with isotropic samples," Meas. Sci. Technol., vol.17, pp. 145-152, 2006.
30. M. J. Akhtar, L. E. Feher, and M. Thumm, "A closed-form solution for reconstruction of permittivity of dielectric slabs placed at the center of a rectangular waveguide," IEEE Geosci. Remote Sens. Lett., vol.4, no.1, pp. 122-126, Jan. 2007.
31. C. A. Balanis, Advanced Engineering Electromagnetics. Hoboken, NJ: Wiley, 1989.
32. R. F. Harrington, Time-Harmonic Electromagnetic Fields. New York: Wiley/IEEE Press, 2001.
33. R. E. Collin, Field Theory of Guided Waves. New York: IEEE Press, 1991.
34. Waveguide Handbook, N. Marcuvitz, Ed. New York: McGraw-Hill, 1951.
35. D. M. Pozar, Microwave Engineering. Hoboken, NJ: Wiley, 2005.
36. P. H. Vartanian, W. P. Ayres, and A. L. Helgesson, "Propagation in dielectric slab loaded rectangular waveguide," IRE Trans. Microw. Theory Tech., vol.MTT-5, no.2, pp. 215-222, Apr. 1958.
37. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C: The Art of Scientific Computing. New York: Cambridge Univ. Press, 1992.
38. Y. Huang and M. Nakhkash, "Characterization of layered dielectric medium using reflection coefficient," Electron. Lett., vol.34, pp. 1207-1208, 1998. (Pubitemid 128610426)
39. S. Wang, M. Niu, and D. Xu, "A frequency-varying method for simultaneous measurement of complex permittivity and permeability with an open-ended coaxial probe," IEEE Trans. Microw. Theory Tech., vol.46, no.12, pp. 2145-2147, Dec. 1998.
40. J. Baker-Jarvis, R. G. Geyer, and P. D. Domich, "A nonlinear least-squares solution with causality constraints applied to transmission line permittivity and permeability determination," IEEE Trans. Instrum. Meas., vol.41, no.5, pp. 646-652, Oct. 1992.
41. G. F. Engen and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Microw. Theory Tech., vol.MTT-27, no.12, pp. 987-993, Dec. 1979.
42. K. Chalapat, K. Savala, J. Li, and G. S. Paraoanu, "Wideband reference- plane invariant method measuring electromagnetic parameters of materials," IEEE Trans. Microw. Theory Tech., vol.57, no.9, pp. 2257-2267, Sep. 2009.
43. U. C. Hasar and O. E. Inan, "Elimination of the dependency of the calibration plane and the sample thickness from complex permittivity measurements of thin materials," Microw. Opt. Technol. Lett., vol.51, no.7, pp. 1642-1646, Jul. 2009.
44. U. C. Hasar, "Simple calibration plane-invariant method for complex permittivity determination of dispersive and non-dispersive low-loss materials," IET Microw. Antennas Propag., vol.3, no.4, pp. 630-637, Jun. 2009.
45. A. R. Von Hippel, Dielectric Materials and Applications. New York: Wiley, 1954.
46. U. C. Hasar, "A new calibration-independent method for complex permittivity extraction of solid dielectric materials," IEEE Microw. Wireless Compon. Lett., vol.18, no.12, pp. 788-790, Dec. 2008.
47. U. C. Hasar and O. Simsek, "A calibration-independent microwave method for position-insensitive and nonsingular dielectric measurements of solid materials," J. Phys. D, Appl. Phys., vol.42, no.7, pp. 075 403-075 412, 2009.
48. U. C. Hasar, "A new microwave method for electrical characterization of low-loss materials," IEEE Microw. Wireless Compon. Lett., vol.19, no.12, pp. 801-803, Dec. 2009.