A microwave method for noniterative constitutive parameters determination of thin low-loss or lossy materials

IEEE Transactions on Microwave Theory and Techniques

Volumn 57, Issue 1, 2009, Pages 1595-1601

  Hasar, Ugur Cem ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

Materials testing; Microwave measurements; Permeability; Permittivity

Indexed keywords

COMPLEX PERMITTIVITY; CONSTITUTIVE PARAMETERS; ELECTRICAL PROPERTY; INITIAL GUESS; LOSSY MATERIALS; LOW LOSS; MICROWAVE METHODS; NON-ITERATIVE; PERMEABILITY; PRIOR INFORMATION; REFLECTION MEASUREMENTS; REFLECTION PROPERTIES; SAMPLE HOLDERS; SEARCH ALGORITHMS;

ELECTRIC PROPERTIES; MATERIALS PROPERTIES; MATERIALS TESTING; MICROWAVE MEASUREMENT; PERMITTIVITY;

MEASUREMENTS;

EID: 77958109397     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (34)

1. L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization. West Sussex, U.K.: Wiley, 2004.
2. A. M. Nicolson and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., vol. IM-19, no. 4, pp. 377-388, Nov. 1970.
3. W. B. Weir, "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, vol. 62, no. 1, pp. 33-36, Jan. 1974.
4. J. Baker-Jarvis, E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., vol. 38, no. 8, pp. 1096-1103, Aug. 1990.
5. T. C.Williams, M. A. Stuchly, and P. Saville, "Modified transmissionreflection method for measuring constitutive parameters of thin flexible high-loss materials," IEEE Trans. Microw. Theory Tech., vol. 51, no. 5, pp. 1560-1566, May 2003.
6. K. J. Bois, L. F. Handjojo, A. D. Benally, K. Mubarak, and R. Zoughi, "Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials," IEEE Trans. Instrum. Meas., vol. 48, no. 6, pp. 1141-1148, Dec. 1999.
7. U. C. Hasar and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., vol. 57, no. 2, pp. 471-477, Feb. 2009.
8. U. C. Hasar, "A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., vol. 56, no. 9, pp. 2129-2135, Sep. 2008.
9. U. C. Hasar, "Two novel amplitude-only methods for complex permittivity determination of medium-and low-loss materials," Meas. Sci. Techol., vol. 19, no. 5, pp. 055706-055715, May 2008.
10. J. Baker-Jarvis, M. D. Janezic, J. H. Grosvenor, Jr., and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability," NIST, Boulder, CO, Tech. Note 1355, May 1992.
11. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C: The Art of Scientific Computing. New York: Cambridge Univ. Press, 1992.
12. D. E. Muller, "A method for solving algebraic equations using an automatic computer," Math. Tables, Aids Comput., vol. 10, pp. 208-215, 1956.
13. W. E. Schiesser, Computational Mathematics in Engineering and Applied Science: ODEs, DAEs and PDEs. Boca Raton, FL: CRC, 1994.
14. S. H. Talisa, "Application of Davidenko's method to the solution of dispersion relations in lossy waveguiding systems," IEEE Trans. Microw. Theory Tech., vol. MTT-33, no. 10, pp. 967-971, Oct. 1985.
15. H. A. N. Hejase, "On the use of Davidenko's method in complex root search," IEEE Trans. Microw. Theory Tech., vol. 41, no. 1, pp. 141-143, Jan. 1993.
16. F. L. Penaranda-Foix, J. M. Catala-Civera, M. Contelles-Cervera, and A. J. Canos-Marin, "Solving the cut-offwave numbers in partially filled rectangular waveguides by the Cauchy integral method," Int. J. RF Microw. Comput.-Aided Eng., vol. 16, pp. 502-509, 2006.
17. R. Rodrigez-Berral, F. Mesa, and F. Medina, "Systematic and efficient root finder for computing the modal spectrum of planar layered waveguides," Int. J. RF Microw. Comput.-Aided Eng., vol. 14, no. 1, pp. 73-83, Jan. 2004.
18. M. E. Baginski, D. L. Faircloth, and M. D. Deshpande, "Comparison of two optimization techniques for the estimation of complex permittivities of multilayered structures using waveguide measurements," IEEE Trans. Microw. Theory Tech., vol. 53, no. 10, pp. 3251-3259, Oct. 2005.
19. M. A. Luersen and R. Le Riche, "Globalized Nelder-Mead method for engineering optimization," Comput. Struct., vol. 82, no. 23-26, pp. 2251-2260, 2004.
20. R. Olmi, M. Tedesco, C. Riminesi, and A. Ignesti, "Thickness- independent measurement of the permittivity of thin samples in the X band," Meas. Sci. Technol., vol. 13, no. 4, pp. 503-509, Apr. 2002.
21. A. H. Muqaibel and A. Safaai-Jazi, "A new formulation for characterization of materials based on measured insertion transfer function," IEEE Trans. Microw. Theory Tech., vol. 51, no. 8, pp. 1946-1951, Aug. 2003.
22. C. A. Balanis, Advanced Engineering Electromagnetics. Hoboken, NJ: Wiley, 1989.
23. P. I. Somlo and J. D. Hunter, "Condition for reflection coefficient magnitude greater than one for passive transmission line and passive load," IEEE Trans. Instrum. Meas., vol. IM-30, no. 3, pp. 230-231, Sep. 1981.
24. S. Trabelsi, A. W. Kraszewski, and S. O. Nelson, "Phase-shift ambiguity in microwave dielectric properties measurements," IEEE Trans. Instrum. Meas., vol. 49, no. 1, pp. 56-60, Feb. 2000.
25. U. C. Hasar, "Elimination of the multiple-solutions ambiguity in permittivity extraction from transmission-only measurements of lossy materials," Microw. Opt. Technol. Lett., vol. 51, no. 2, pp. 337-341, Feb. 2009.
26. E. Ni, "An uncertainty analysis for the measurement of intrinsic properties of materials by the combined transmission-reflection method," IEEE Trans. Instrum. Meas., vol. 41, no. 4, pp. 495-499, Aug. 1992.
27. J. Ness, "Broad-band permittivity measurements using the semi-automatic network analyzer," IEEE Trans. Microw. Theory Tech., vol. MTT-33, no. 11, pp. 1222-1226, Nov. 1985.
28. G. F. Engen and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Microw. Theory Tech., vol. MTT-27, no. 12, pp. 987-993, Dec. 1979.
29. S. J. Kline and F. A. McClintock, "Describing uncertainties in singlesample experiments," Mech. Eng., vol. 75, pp. 3-, Jan. 1953.
30. Hewlett-Packard Company, Santa Rosa, CA, "HP 8719C, HP 8720C, HP 8722C network analyzers," Tech. Data, 1992.
31. R. Zoughi and S. Bakhtiari, "Microwave nondestructive detection and evaluation of disbonding and delamination in layered-dielectric slabs," IEEE Trans. Instrum. Meas., vol. 39, no. 6, pp. 1059-1063, Dec. 1990.
32. J. B. Hasted, Aqueous Dielectrics. London, U.K.: Chapman & Hall, 1973.
33. T. Sato and A. Chiba, "Hydrophobic hydration and molecular association in methanol-water mixtures studied by microwave dielectric analysis," J. Chem. Phys., vol. 112, no. 6, pp. 2924-2932, Feb. 2000.
34. S. I. Ganchev, N. Qaddoumi, E. Ranu, and R. Zoughi, "Microwave detection optimization of disbond in layered dielectrics with varying thickness," IEEE Trans. Instrum. Meas., vol. 44, no. 2, pp. 326-328, Apr. 1995.