SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 5, 2009, Pages

A microcontroller-based microwave free-space measurement system for permittivity determination of lossy liquid materials

(1) Hasar, U C a

a ATATÜRK UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION TECHNIQUES; COMPLEX PERMITTIVITY; DIFFERENT FREQUENCY; DYNAMIC DETERMINATION; FREE SPACE MEASUREMENTS; GENERAL PURPOSE; LIQUID MATERIALS; LIQUID SAMPLE; MEASUREMENT SYSTEM; MICROWAVE COMPONENTS; NON DESTRUCTIVE; NON-CONTACT; REFLECTION COEFFICIENTS; REFLECTION MEASUREMENTS; SAMPLE THICKNESS;

CONTROLLERS; LIQUIDS; MICROCONTROLLERS; MICROWAVES; REFLECTION; SYSTEMATIC ERRORS;

PERMITTIVITY;

EID: 66549090441 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3124795 Document Type: Article

Times cited : (16)

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