A self-checking technique for materials characterization using calibration-independent measurements of reflecting lines

Microwave and Optical Technology Letters

Volumn 51, Issue 1, 2009, Pages 129-132

  Hasar, U C ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York at Binghamton   (United States)

Author keywords

Calibration; Microwave measurement; Permittivity measurement; Scattering parameters

Indexed keywords

COMPLEX PERMITTIVITY (CP); PARAMETER MEASUREMENTS; PERFORMANCE EVALUATION (PE);

CALIBRATION; DIELECTRIC MATERIALS; MICROWAVE MEASUREMENT; MICROWAVES; NUMERICAL METHODS; PERMITTIVITY; PERMITTIVITY MEASUREMENT; PROBABILITY DENSITY FUNCTION; SCATTERING; SCATTERING PARAMETERS; WIRELESS TELECOMMUNICATION SYSTEMS;

MEASUREMENTS;

EID: 58449086142     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.23978     Document Type: Article

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