A generalized formulation for permittivity extraction of low-to-high-loss materials from transmission measurement

IEEE Transactions on Microwave Theory and Techniques

Volumn 58, Issue 2, 2010, Pages 411-418

  Hasar, Ugur Cem ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

Materials testing; Microwave measurements; Permittivity

Indexed keywords

BROADBAND APPLICATIONS; COMPLEX PERMITTIVITY; COMPLEX PERMITTIVITY MEASUREMENT; DISPERSIVE MATERIALS; FAST COMPUTATION; HIGHER FREQUENCIES; LOSS PROPERTIES; LOW LOSS; LOW LOSS MATERIAL; LOW-TO-HIGH; LOWER FREQUENCIES; MEASUREMENT TOOLS; ONE FREQUENCY; PERMITTIVITY EXTRACTION; TEST SAMPLES; TRANSMISSION MEASUREMENTS;

FREQUENCY BANDS; MATERIALS; MATERIALS TESTING; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY; PERMITTIVITY MEASUREMENT;

MEASUREMENTS;

EID: 76849117672     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2009.2038443     Document Type: Article

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